diff --git a/src/views/eam/device/deviceinspectionjob/deviceInspectionMain.data.ts b/src/views/eam/device/deviceinspectionjob/deviceInspectionMain.data.ts
index 3e2b53e..3461703 100644
--- a/src/views/eam/device/deviceinspectionjob/deviceInspectionMain.data.ts
+++ b/src/views/eam/device/deviceinspectionjob/deviceInspectionMain.data.ts
@@ -683,6 +683,7 @@ export const DeviceInspectionDetail = useCrudSchemas(
         searchListPlaceholder: '请选择备件',
         searchField: 'itemNumbers1',
         searchTitle: '备件',
+        isSearchTableItem:true,
         multiple: true,
         searchAllSchemas: ItemSearchTable.allSchemas,
         searchPage: ItemApi.getItemList,